Manufacturing, Nikon's streamlined production system, featuring the 3D CAD program, is now employed in measurement and inspection processes. Nikon has shortened the time for product launches and reduced development costs in all product lineups through the use of 3D CAD data for 3D digital measurement and inspection processes. Nov 10, 2012  Sigma had a MASSIVE re-chipping program a few years back. Click to expand. Its the newest model, and I don't believe its that old. I'm the second owner though so I'm not sure. I traded a Nikon 24-70 for the Sigma 24-70 and a Nikon 80-200 AFS. Nikon inspection and adjustment for d7000, nikon inspection and adjustment software.

It is important for automotive assembly plants to continuously monitor process quality during the manufacturing process. Locations of holes, slots, studs, welding lines and other features need to be measured on the vehicles in Body in White (BI W) assembly. Also, flush & gap for door or hinge lines need in-depth verification in the Trim and Finish section. These inspections ensure that vehicles are built within the stringent tolerances set by automotive manufacturers.These measurements in the past have been primarily performed by either horizontal arm CMMs offline or on the production line using dozens of sensors individually aimed at each of the features that are to be inspected.Although CMMs provide highly accurate absolute measurements, they require an expensive metrology lab and can only be used offline. A large amount of time is required to remove the vehicle from the line, fixture and align it in the CMM and then perform the time-consuming measurements. At best, two vehicles can be inspected per shift on a CMM. This is a very small sample considering that over 1000 vehicles can be built each day in a single automotive plant.Traditional inline systems can have over 100 fixed sensors that are all individually aimed at features on the vehicles.

These fixed sensors are demanding to install and maintain and do not provide ‘absolute measurements’ of the features in the car’s coordinate system. They can only detect presence/absence of the features in a local reference frame making it impossible to do a complete dimensional check on the vehicle. Multi-sensor inline inspection system withfixed camerasIn addition, most assembly lines now are ‘flexible’, meaning that they can produce more than one type of vehicle. Fixed sensors cannot be used between different vehicles styles, every vehicle requires it’s own custom set of sensors.Nikon Metrology’s Laser RadarThe Laser Radar provides a unique alternative to the shortcomings of the traditional inspection methods.

The Laser Radar performs automated, highly accurate, contactless measurements by using a focused laser that is controlled by precision azimuth and elevation drives. To perform a measurement, the Laser Radar only needs a fraction of the laser’s signal to be returned giving it the ability to measure almost any surface, including highly reflective bare body panels as well as shiny painted surfaces and even lights, which are very difficult to measure with typical line scanners. This robust measurement ability means that the Laser Radar can be used for both BI W and Flush and Gap inspections on finished cars.The Laser Radar also has a large measurement range (up to 50m for the MV350), allowing it to easily measure objects that have the size of cars, trucks, and other large vehicles. Dual horizontal arm setup for Body-in-White inspectionInline inspection with the Laser RadarFor the inline inspection, Laser Radars are mounted to 6-axis robot arms that are located on each side of the production line. This type of robot is common place in automotive production facilities, is very robust and can easily handle the payload of the Laser Radar.The robots are used to automatically reposition the Laser Radar so it can inspect areas that are hidden from the line of sight of a single Laser Radar location. For example the door frame or other body panels could be blocking the line-of-sight to some features on the floor pan; repositioning the Laser Radar to an alternate location will make these features visible one again without the need for multiple sensors.After the robot repositions the Laser Radar, it automatically measures alignment points on the vehicle or pallet.

This occurs each time the robot moves the Laser Radar, guaranteeing that all measurements are collected in vehicle coordinates and ensuring measurement accuracy is independent of the robots ability to position the Laser Radar.In each location the Laser Radar can measure dozens of features on the vehicle. These measurements are preprogrammed in the inspection software directly from the vehicle’s CAD model. After the initial programming, data collection and reporting is fully automated.Unique inspection scripts can also be written for each vehicle style and model made on the production line making the Laser Radar inspection station completely flexible. Adding vehicle styles in the future only requires re-programming of the inspection plan and does not require any physical changes or new hardware.The interaction of the Laser Radar, robot, and analysis software are fully integrated; the inspections are completely automated and do not require manual intervention during runtime, improving both the speed and quality of the measurements over traditional methods.Laser Radar features. Laser radars mounted on a robot automatically inspect vehicles directly on the assembly lineThe Laser Radar is a programmable contactless measurement system and has an accuracy.

Nikon Instruments Inc. Announced its new Dynamic Auto-Focus unit, the LV-DAF, bringing fast, versatile auto-focus to the Eclipse LV semiconductor inspection microscope series and OEM applications.

Featuring the newly developed Hybrid Auto-Focus system, the LV-DAF offers a large focus range and fast tracking ability through a combination of slit projection and contrast detection auto focus. The result is a highly-versatile system that can be used for a wide range of imaging techniques.In pairing the two auto-focus technologies, the LV-DAF provides a focal range that is significantly larger than with contrast detection alone. This means that samples with distortion on their surface, such as liquid crystal substrate, can now be rapidly tracked, enabling speedy focusing. To further support sample variety, the LV-DAF uses a bright light LED for the auto-focus light source.

This allows the system to focus on wide range of samples ranging from low to high reflectivity. A wide range of observation methods is also supported, including brightfield, darkfield and differential interference contrast (DIC), as well as reflective and transparent samples.'

The LV microscopes are known for their unprecedented versatility for OEM applications as well as for wafer inspection,' said Mike Metzger, General Manager, Sales and Marketing. 'In developing the LV-DAF, Nikon has been able to expand those offerings even further and provide superior options to our industrial customers.' The Auto-Adjustment Program, which is included as standard, enables simple and speedy system setup. The program performs immediate auto-adjustment after the user focuses the system and presses the button to start the setup.

Certified control systems study guide. Video 2 in Series - Exam Content Overview - What to expect and possible shortcomings.Control Systems Design and Troubleshooting for Engineering and Technology - Prepare for the CSE/PE, CAP, CCST I, II, III exams.This video is an overview of the NCEES CSE/PE (Control Systems Engineer/Professional Engineer) and CAP (Certified Automation Professional) Examinations for Control Systems Engineering. It uses the ISA Control Systems Engineer Review Manual: Control Systems Engineering Exam Reference Manual - A Practical Study Guide, Third Edition.It also parallels much of the subject material needed for the CCST (Certified Control Systems Technician) I, II, III examinations.Visit for more training and resources in industrial and commercial control systems and instrumentation design, as well as industrial networking applications.

It is also possible to automatically set optimal parameters for each type of sample and recall them in accordance to the sample being photographed.The LV-DAF can be controlled from a PC or a DS-L2 digital camera system for microscopes via USB or RS232C. The controller features the same hardware design as the LV-ECON and has a compact footprint that allows them to be stacked on each other and used anywhere. Additionally, Nikon provides a software development kit to help ease integration of the LV-DAF into a variety of systems.